The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 29, 2025

Filed:

Jan. 20, 2022
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Jun Zhu, San Diego, CA (US);

Mihir Vijay Laghate, San Diego, CA (US);

Raghu Narayan Challa, San Diego, CA (US);

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04W 24/08 (2008.12); H04B 7/06 (2005.12); H04W 4/02 (2017.12); H04W 36/08 (2008.12);
U.S. Cl.
CPC ...
H04W 24/08 (2012.12); H04B 7/0695 (2012.12); H04W 4/025 (2012.12); H04W 36/08 (2012.12);
Abstract

Methods, systems, and devices for wireless communications are described that provide for a user equipment (UE) to detect motion of the UE based on a motion sensor, such as an inertial measurement unit (IMU). The UE, based on the detected motion, may trigger a measurement procedure in which measurements of different beams or cells are performed at a greater periodicity than if the motion were not detected. The indication from the motion sensor may indicate that UE acceleration, rotation, orientation, or any combinations thereof, exceeds a threshold and results in the UE switching to a fastest available measurement periodicity. After triggering the fastest available measurement periodicity, the UE may adjust the measurement periodicity based on newly obtained beam measurements and converge to a measurement periodicity based on observed metrics.


Find Patent Forward Citations

Loading…