The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 29, 2025

Filed:

Sep. 13, 2022
Applicant:

Christie Digital Systems Usa, Inc., Cypress, CA (US);

Inventors:

Matthew Post, Brampton, CA;

Peter Anthony Van Eerd, Guelph, CA;

Anda Achimescu, Kitchener, CA;

Huck Kim, Waterloo, CA;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 9/31 (2005.12); H04N 13/254 (2017.12);
U.S. Cl.
CPC ...
H04N 9/317 (2012.12); H04N 9/3147 (2012.12); H04N 9/3179 (2012.12);
Abstract

A method is provided of parallel gathering of structured light patterns in multi-projector systems, comprising sequentially projecting images from each of a plurality of projectors on a surface; capturing the sequentially projected images on the surface via at least one sensing device; creating one or more sensing device/projector masks for limiting the images projected by each of the plurality of projectors to portions that do not conflict with images projected by other ones of the plurality of projectors; using the one or more projector masks to create a graph of projectors whose projections conflict; and creating from the graph a plurality of gather groups wherein projectors within a group do not conflict with each other for simultaneously gathering structured light patterns from projectors in each of the gather groups.


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