The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 29, 2025
Filed:
Dec. 20, 2024
Zhejiang University, Zhejiang, CN;
Donghai Laboratory, Zhejiang, CN;
Chunyi Song, Zhoushan, CN;
Haotian Chen, Zhoushan, CN;
Nayu Li, Zhoushan, CN;
Zhiwei Xu, Zhoushan, CN;
Xinhong Xie, Zhoushan, CN;
Zixian Ma, Zhoushan, CN;
Bing Lan, Zhoushan, CN;
ZHEJIANG UNIVERSITY, Zhoushan, CN;
DONGHAI LABORATORY, Zhoushan, CN;
Abstract
Disclosed is a method for fast automatic calibration of a phased array based on a residual neural network. A phase setting matrix is set and an amplitude and a phase of a array far-field complex signal are measured with a network analyzer to obtain an amplitude and phase vector of the array far-field complex signal. A real part, an imaginary part, and a magnitude of the far-field measured complex signal value are separated and normalized, and mapped to RGB three-channel image data. Datasets are automatically generated according to a preset amplitude-phase error range by a simulation software, the datasets are proportionally divided into a training set and a test set to be input into the residual neural network for training to obtain a calibration model. Measured data is input into the calibration model for automatic estimation of the amplitude-phase error of the phased array.