The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 29, 2025
Filed:
Jul. 28, 2021
Applicant:
Samsung Electronics Co., Ltd., Suwon-si, KR;
Inventors:
Srenivas Varadarajan, Bangalore, IN;
Anamika Sharma, Jabalpur, IN;
Assignee:
SAMSUNG ELECTRONICS CO., LTD., Suwon-si, KR;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2021.12); G06T 7/00 (2016.12); G06T 7/11 (2016.12); G06T 7/246 (2016.12); G06T 7/269 (2016.12);
U.S. Cl.
CPC ...
G06T 7/246 (2016.12); G06T 7/0002 (2012.12); G06T 7/11 (2016.12); G06T 7/269 (2016.12); G06T 2207/30168 (2012.12);
Abstract
The present disclosure provides a method of analyzing an image captured from an imaging device. The method includes receiving one or more images captured from a camera over a predetermined time period. Feature extraction and tracking are executed with respect to the received images. One or more features are detected as untracked features during the feature extraction and tracking. A geometrical prediction is executed with respect to the untracked features to predict one or more features and thereby achieving the one or more untracked features as the one or more tracked features.