The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 29, 2025
Filed:
Jun. 01, 2022
Applicant:
Duke University, Durham, NC (US);
Inventors:
Pratik Bokadia, Durham, NC (US);
Amey Chaware, Durham, NC (US);
Roarke Horstmeyer, Durham, NC (US);
Kanghyun Kim, Durham, NC (US);
Pavan Konda, Durham, NC (US);
Assignee:
Duke University, Durham, NC (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 3/08 (2022.12); G02B 21/06 (2005.12); G02B 21/36 (2005.12); G06V 10/143 (2021.12); G06V 10/145 (2021.12); G06V 10/82 (2021.12); G06V 20/69 (2021.12);
U.S. Cl.
CPC ...
G06N 3/08 (2012.12); G02B 21/06 (2012.12); G02B 21/365 (2012.12); G06V 10/143 (2021.12); G06V 10/145 (2021.12); G06V 10/82 (2021.12); G06V 20/698 (2021.12);
Abstract
The present disclosure describes a computational imaging system that uses a supervised learning algorithm to jointly process the captured image data to identify task-optimal hardware settings and then uses the task-optimal hardware settings to dynamically adjust its hardware to improve specific performance. The primary application of this device is for rapid and accurate automatic analysis of images of biological specimens.