The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 29, 2025

Filed:

Sep. 07, 2023
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventor:

Fumiaki Hirose, Saitama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 15/02 (2005.12); H04N 1/00 (2005.12);
U.S. Cl.
CPC ...
G06K 15/1836 (2012.12); H04N 1/00037 (2012.12);
Abstract

To make it possible to easily set an inspection level in accordance with the type of contents included in a printed material. First, based on PDL included in a print job, a raster image is generated and a contents attribute different from an object attribute predefined by the PDL is identified by analyzing the raster image. Then, inspection level information in accordance with the identified contents attribute is assigned to the generated raster image and the raster image is provided to an inspection apparatus.


Find Patent Forward Citations

Hirose, Fumiaki. (2025). Information processing apparatus, inspection system, information processing method, and storage medium for inspecting printed material (U.S. Patent No. 12288110). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12288110

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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