The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 29, 2025

Filed:

Jul. 09, 2021
Applicant:

Fanuc Corporation, Yamanashi, JP;

Inventor:

Tomofumi Uwano, Yamanashi, JP;

Assignee:

FANUC CORPORATION, Yamanashi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/20 (2018.12); G06F 16/22 (2018.12); G06F 16/2457 (2018.12);
U.S. Cl.
CPC ...
G06F 16/24578 (2018.12); G06F 16/2246 (2018.12);
Abstract

An analysis device according to the present disclosure is provided with: a data acquisition unit that acquires data detected by an industrial machine; an operation state extraction unit that extracts, from the data, data detected during operation of the industrial machine; an annotation unit that creates a plurality of data set groups by giving, on the basis of a predetermined standard, annotations indicating motion states of the industrial machine to a plurality of data sets segmented by a predetermined standard from the extracted data during the operation; a feature amount extraction unit that extracts a feature amount of data included in each of the data sets; a learning unit that generates decision tree models respectively for the plurality of data set groups; and a display unit that ranks the generated decision tree models on the basis of correct answer rates regarding prediction of the annotations based on predetermined training data and that displays the decision tree models.


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