The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 29, 2025

Filed:

Mar. 15, 2021
Applicant:

Nitto Denko Corporation, Osaka, JP;

Inventors:

Tomoya Matsuda, Osaka, JP;

Yudai Numata, Osaka, JP;

Masato Katsuda, Osaka, JP;

Shoichi Matsuda, Osaka, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 5/20 (2005.12); G02B 5/02 (2005.12);
U.S. Cl.
CPC ...
G02B 5/206 (2012.12); G02B 5/0242 (2012.12); G02B 5/208 (2012.12);
Abstract

An optical filter () comprises a matrix () and fine particles () dispersed in the matrix (), wherein the fine particles () have a parameter Ds of 8.0 to 30 inclusive, Ds being determined by a USAXS pattern and given by Ds=λ/(B·cos θ·Ra), where λ is the X-ray wavelength, θ is one half the scattering angle 2θ(rad) providing a scattering intensity peak, B is the half width (FWHM, rad) of the peak, and Ra is the average particle size of the fine particles ().


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