The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 29, 2025

Filed:

Jun. 16, 2021
Applicant:

Shandong University, Shandong, CN;

Inventors:

Shucai Li, Jinan, CN;

Yiguo Xue, Jinan, CN;

Maoxin Su, Jinan, CN;

Chunjin Lin, Jinan, CN;

Li Guan, Jinan, CN;

Daohong Qiu, Jinan, CN;

Zhiqiang Li, Jinan, CN;

Yimin Liu, Jinan, CN;

Peng Wang, Jinan, CN;

Huimin Gong, Jinan, CN;

Assignee:

SHANDONG UNIVERSITY, Jinan, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 3/20 (2005.12); G01V 8/02 (2005.12);
U.S. Cl.
CPC ...
G01V 8/02 (2012.12);
Abstract

A three-dimensional imaging method and system for surface comprehensive geophysical prospecting, the method includes: acquiring detection data of a plurality of two-dimensional profiles of a surface detection site; forming two-dimensional profile resistivity data by geophysical inversion of the detection data; performing three-dimensional coordinate conversion on the two-dimensional profile resistivity data to obtain resistivity data of a three-dimensional coordinate system; and converting the resistivity data of the three-dimensional coordinate system into a three-dimensional model by using a Kriging interpolation method.


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