The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 29, 2025
Filed:
May. 06, 2022
Landmark Graphics Corporation, Houston, TX (US);
Xuan Nam Nguyen, Houston, TX (US);
Sinan Tufekci, Houston, TX (US);
Alejandro Jaramillo, Edinburgh, GB;
Landmark Graphics Corporation, Houston, TX (US);
Abstract
The disclosure presents processes to automatically generate one or more set of fault segments from a fault plane pointset. The processes can identify a predominant direction and derive a set of fault segments from the fault plane pointset, where the fault segments are generated by using slices of data from the fault plane pointset that are perpendicular to the predominant direction. For each slice of data, the fault segments can be analyzed with neighboring fault segments to determine if they are overlapping. Fault segments that block or overlap other fault segments can be assigned to a different subset of fault segments from the underlying fault segments. Gaps in the fault plane pointset, and the resulting set of fault segments, can be filled in by merging neighboring fault segments above and below the gap if the neighboring fault segments satisfy a criteria for filling the gap.