The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 29, 2025

Filed:

Jan. 14, 2024
Applicant:

Institute of Geology and Geophysics, Chinese Academy of Sciences, Beijing, CN;

Inventors:

Fei Tian, Beijing, CN;

Qingyun Di, Beijing, CN;

Wenhao Zheng, Beijing, CN;

Yongyou Yang, Beijing, CN;

Wenjing Cao, Beijing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 1/28 (2005.12); G01V 1/40 (2005.12);
U.S. Cl.
CPC ...
G01V 1/282 (2012.12); G01V 1/40 (2012.12);
Abstract

The present invention belongs to the technical field of geological exploration deep Earth. The system of the present invention is configured to: collect seismic data, and preprocess original seismic data to obtain standardized gamma ray logging parameters; extract features from the standardized gamma ray logging parameters to obtain a variance attribute curve while drilling; obtaining a formation thickness prediction model of each set based on the variance attribute curve while drilling; acquire frequency-division seismic data based on the standardized seismic data by means of a frequency-division processing method based on wavelet transform; acquire optimal seismic frequency band information based on a predicted formation thickness value of each set; establish a geological prediction model of the current formation based on the frequency-division seismic data, the optimal seismic frequency band information, historical gamma ray logging parameters and the standardized gamma ray logging parameters.


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