The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 29, 2025
Filed:
Feb. 25, 2021
Mitsubishi Electric Corporation, Tokyo, JP;
Gaku Nakanishi, Tokyo, JP;
Takahiro Mizuno, Tokyo, JP;
Mitsubishi Electric Corporation, Tokyo, JP;
Abstract
A test object includes a first semiconductor element, a first main electrode electrically connected to a positive electrode of the first semiconductor element, a second main electrode electrically connected to a negative electrode of the first semiconductor element, and a first capacitor connected between the first main electrode and the second main electrode. A semiconductor testing device comprises a DC power supply connected between a first probe and a second probe, and a controller. When the first probe is connected to the first main electrode and the second probe is connected to the second main electrode, the controller charges the first capacitor with a DC voltage supplied from a DC power supply, and inputs, to a control electrode of the first semiconductor element, a control signal for turning on the first semiconductor element, after charging the first capacitor.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile