The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 29, 2025
Filed:
Oct. 20, 2022
Helmut Fischer Gmbh Institut Für Elektronik Und Messtechnik, Sindelfingen, DE;
Martin Leibfritz, Deckenpfronn, DE;
HELMUT FISCHER GMBH INSTITUT FÜR ELEKTRONIK UND MESSTECHNIK, Sindelfingen, DE;
Abstract
A measurement object is placed on a region of a measuring table, and an overview image of the region of the measuring table is captured by an optical device. A type of the measurement object is determined from the overview image or from an identifier on the measurement object or an identifier positioned adjacently thereto. The position and/or the alignment of the measurement object on the measurement table is determined from the overview image. At least one measurement location of the measurement object is positioned in a measurement point of an X-ray fluorescence device and at least one measured value is determined from the at least one measurement location of the measurement object. The at least one measured value is compared with a setpoint value stored in a data processing device and a measurement result for the at least one measurement location of the measurement object is output.