The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 29, 2025
Filed:
Dec. 16, 2020
Beijing Rslaser Opto-electronics Technology Co., Ltd., Beijing, CN;
Guangyi Liu, Beijing, CN;
Rui Jiang, Beijing, CN;
Xiaoquan Han, Beijing, CN;
Jiangshan Zhao, Beijing, CN;
Pengfei Sha, Beijing, CN;
Qingqing Yin, Beijing, CN;
Hua Zhang, Beijing, CN;
Xinyue Hu, Beijing, CN;
Beijing RSLaser Opto-Electroncis Technology Co., Ltd., Beijing, CN;
Abstract
Provided are a device () and a method for online measuring a spectrum for a laser device. The device () for online measuring a spectrum for a laser device includes: a first optical path assembly (G) and a second optical path assembly (G), and the second optical path assembly (G) and the first optical path assembly (G) constitute a measurement optical path. The second optical path assembly (G) includes: an FP etalon () and a grating (). The homogenized laser beam passes through the FP etalon () to generate an interference fringe. The grating () is arranged after the FP etalon (), or is arranged before the FP etalon () in the measurement optical path, and is configured to disperse the laser beam passing through the FP etalon ().