The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 29, 2025
Filed:
Mar. 04, 2024
Harbin Institute of Technology, Harbin, CN;
Haijin Fu, Harbin, CN;
Xiaobo Su, Harbin, CN;
Liang Yu, Harbin, CN;
Pengcheng Hu, Harbin, CN;
Xizheng Liu, Harbin, CN;
Xin Yang, Harbin, CN;
HARBIN INSTITUTE OF TECHNOLOGY, Harbin, CN;
Abstract
A heterodyne laser interferometer and a measurement method based on an integrated dual polarization beam-splitting assembly is provided. Technical points: The first polarization beam splitter and the second polarization beam splitter of the integrated dual polarization beam-splitting assembly are arranged in parallel. The first polarization beam splitter is attached with a first polarizer, a third polarizer, and a first quarter-wave plate; The second polarization beam splitter is attached with a second polarizer, a fourth polarizer, and a second quarter-wave plate; The output optical path of the first quarter-wave plate and the second quarter-wave plate is equipped with target mirrors, while the output optical path of the third quarter-wave plate and the fourth quarter-wave plate is equipped with photodetectors. The assembly and adjustment of the present invention is more flexible and reduce the processing difficulty and processing error.