The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 29, 2025

Filed:

Dec. 17, 2021
Applicant:

Xsys Prepress NV, Ypres, BE;

Inventor:

Bart Marc Luc Wattyn, Dentergem, BE;

Assignee:

XSYS PREPRESS NV, Ypres, BE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B25J 9/04 (2005.12); B25J 13/08 (2005.12); B25J 15/06 (2005.12); B41C 1/00 (2005.12); B41F 27/12 (2005.12); B41N 3/00 (2005.12); B65G 49/06 (2005.12);
U.S. Cl.
CPC ...
B25J 9/042 (2012.12); B25J 13/089 (2012.12); B25J 15/0616 (2012.12); B41C 1/006 (2012.12); B41F 27/1262 (2012.12); B41F 27/1275 (2012.12); B41N 3/00 (2012.12); B41N 3/006 (2012.12); B65G 49/061 (2012.12); B41P 2227/60 (2012.12); B65G 2203/0233 (2012.12);
Abstract

An apparatus for aligning an edge, such as a leading edge of a plate, in particular a printing plate or a printing plate precursor. The apparatus includes a support configured for supporting the plate on a support surface, and to be located upstream of a treatment station. At least two movable elements are arranged to be moved by an edge, such as a leading edge, of the plate. The at least two movable elements include a first and a second movable element; a detection means configured to detect a first and second measure representative for a first and second position of the first and second movable element, respectively, at least one controllable component configured to perform an action on the plate, and a control means configured to control the at least one controllable component based on the first and second measure.


Find Patent Forward Citations

Loading…