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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12285600 B1

PDFFull Text
Date of Patent:
Apr. 29, 2025

Filed:

Dec. 18, 2020

Resistance device, integrated circuit device, implantable device, and correction factor determining method

Applicant:

Osaka University, Osaka, JP;

Inventors:

Seiji Kameda, Suita, JP;

Masayuki Hirata, Suita, JP;

Assignee:

OSAKA UNIVERSITY, Osaka, JP;

Attorney:

Studebaker Brackett PLLC

Primary Examiner:

Hieu P Nguyen

Int. Cl.
CPC ...
H03F 1/30 (2005.12); A61N 1/02 (2005.12); A61N 1/08 (2005.12); G01K 7/00 (2005.12); G05F 1/567 (2005.12); H03G 3/10 (2005.12); H03K 17/081 (2005.12); H03K 17/08 (2005.12);
U.S. Cl.
CPC ...
A61N 1/025 (2012.12); A61N 1/08 (2012.12); G01K 7/00 (2012.12); G05F 1/567 (2012.12); H03K 17/08104 (2012.12); H03K 2017/0806 (2012.12);
Abstract

A resistance device () includes a field-effect transistor (TN) and a voltage applying circuit (). The voltage applying circuit () applies a control voltage (Vgs) between the gate and source of the field-effect transistor (TN) according to a temperature (T) to control a resistance value (R) between the drain and source of the field-effect transistor (TN). The control voltage (Vgs) is a voltage obtained by adding a correction voltage (Vc) to a reference voltage (Vgs). The correction voltage (Vc) depends on the temperature (T) and is set to be zero at a first temperature (T).

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Kameda, Seiji. (2025). Resistance device, integrated circuit device, implantable device, and correction factor determining method (U.S. Patent No. 12285600). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12285600

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