The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 29, 2025
Filed:
Dec. 12, 2022
Medlumics S.l., Madrid, ES;
Juan Sancho Durá, Madrid, ES;
Sara Mas Gómez, Madrid, ES;
David Gonzalez, Alcobendas, ES;
Matthieu Duperron, Madrid, ES;
Carlos Sanz Moreno, Barajas, ES;
Jorge Jimenez, Atlanta, GA (US);
Alexandre Romoscanu, Geneva, CH;
David Herranz Aragoncillo, Alpedrete, ES;
Medlumics S.L., Madrid, ES;
Abstract
Described herein are systems and methods for performing optical signal analysis and lesion predictions in ablations. A system includes a catheter coupled to a plurality of optical fibers via a connector that interfaces with a computing device. The computing device includes a memory and a processor configured to receive optical measurement data of a portion of tissue from the catheter. The processor identifies one or more optical properties of the portion of tissue by analyzing the optical measurement data and determines a time of denaturation of the portion of tissue based on the one or more optical properties. A model is created to represent a correlation between lesion depths and ablation times using the time of denaturation, the one or more optical properties, and the predetermined period of time. A predicted lesion depth for a predetermined ablation time is generated using the model.