The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2025

Filed:

Mar. 27, 2023
Applicant:

Denso Corporation, Kariya, JP;

Inventors:

Yuichi Toyota, Kariya, JP;

Taro Beppu, Kariya, JP;

Chihiro Moriguchi, Kariya, JP;

Hikaru Sasaki, Kariya, JP;

Assignee:

DENSO CORPORATION, Kariya, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 10/11 (2012.12); G01S 7/4911 (2019.12);
U.S. Cl.
CPC ...
H04B 10/11 (2012.12); G01S 7/4911 (2012.12);
Abstract

An optical scanner includes a light source, an optical phased array, a monitoring light receiving unit, and a signal processing unit. The optical phased array implements scanning by a light beam by individually controlling phases of a plurality of branched lights into which light supplied from the light source is branched, using a scanning phase amount, and radiating light from an antenna array that has a plurality of antenna elements. The monitoring light receiving unit receives light radiated from the optical phased array. The signal processing unit detects characteristics of the light beam from a detection result of the monitoring light receiving unit and generate a phase adjustment amount for correcting the scanning phase amount such that a detection value of the characteristics coincides with a design value prepared in advance.


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