The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2025

Filed:

May. 21, 2020
Applicant:

Semiconductor Energy Laboratory Co., Ltd., Atsugi, JP;

Inventors:

Hitoshi Kunitake, Kanagawa, JP;

Kazuki Tsuda, Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 27/14 (2005.12); H01L 27/12 (2005.12); H01L 29/786 (2005.12);
U.S. Cl.
CPC ...
H01L 27/124 (2012.12); H01L 27/1225 (2012.12); H01L 27/1255 (2012.12); H01L 29/78648 (2012.12); H01L 29/7869 (2012.12);
Abstract

Malfunctions of a circuit is prevented and the reliability of a semiconductor device using the circuit is improved. The semiconductor device includes a first transistor, a second transistor, a load, and a wiring having a function of supplying a power supply potential to the load. A semiconductor layer of the first transistor includes an oxide semiconductor. A semiconductor layer of the second transistor includes an oxide semiconductor. A source and a drain of the first transistor are electrically connected to the wiring. A first gate of the first transistor is supplied with a reference potential. A source and a drain of the second transistor are supplied with the reference potential. A first gate of the second transistor is electrically connected to the wiring. The semiconductor layer of the first transistor includes a region overlapping with the wiring. The semiconductor layer of the second transistor includes a region overlapping with the wiring.


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