The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 21, 2025
Filed:
Feb. 26, 2023
Applicant:
SK Hynix Inc., Gyeonggi-do, KR;
Inventors:
Jong Seok Jung, Gyeonggi-do, KR;
Chan Keun Kwon, Gyeonggi-do, KR;
Jong Seok Kim, Gyeonggi-do, KR;
Young Kwan Lee, Gyeonggi-do, KR;
Assignee:
SK hynix Inc., Gyeonggi-do, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/66 (2005.12); G01R 31/26 (2019.12); G01R 31/28 (2005.12);
U.S. Cl.
CPC ...
H01L 22/34 (2012.12); G01R 31/2607 (2012.12); H01L 22/14 (2012.12); H01L 22/32 (2012.12); G01R 31/2879 (2012.12);
Abstract
A test circuit of a semiconductor apparatus includes a first resistor, a second resistor and a feed-back loop circuit. The first resistor is coupled between a pad and a test element. The second resistor is coupled to the first resistor in a parallel manner. The feed-back loop circuit is configured to feed a result back to the second resistor, the result being one of comparing a first voltage and a second voltage with each other, the first voltage and the second voltage being applied respectively to the first resistor and the second resistor.