The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2025

Filed:

Apr. 14, 2021
Applicant:

Hitachi High-tech Corporation, Tokyo, JP;

Inventors:

Hiroshi Morita, Tokyo, JP;

Takashi Kubo, Tokyo, JP;

Minoru Sakamaki, Tokyo, JP;

Shuhei Ishikawa, Tokyo, JP;

Shunichi Watanabe, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/07 (2005.12); H01J 37/09 (2005.12); H01J 37/16 (2005.12); H01J 37/24 (2005.12); H01J 37/295 (2005.12);
U.S. Cl.
CPC ...
H01J 37/07 (2012.12); H01J 37/09 (2012.12); H01J 37/16 (2012.12); H01J 37/241 (2012.12); H01J 37/2955 (2012.12); H01J 2237/0473 (2012.12);
Abstract

Provided is a charged particle beam apparatus capable of realizing a highly reliable insulating structure. This charged particle beam apparatus emits a charged particle beam from a charged particle beam emission device onto a sample, detects charged particles generated from the sample, and creates a sample image or processes the sample. The charged particle beam emission device is provided with a charged particle source and a shield arranged in an interior of a metal housing that is filled with an insulating gas, and an acceleration electrode arranged below the charged particle source, power being supplied to the acceleration electrode via the shield.


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