The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 21, 2025
Filed:
Sep. 03, 2020
Snap Inc., Santa Monica, CA (US);
Orlando Miguel Pires Dos Reis Moreira, Eindhoven, NL;
Louis Rouillard-Odera, Paris, FR;
Snap Inc., Santa Monica, CA (US);
Abstract
A method and system for classifying image content in a sequence (SEQ) of image frames. Frame image data (FI), representing an appearance of image content of the image frames (Fm,Fn), is converted into frame event data (FEn). The conversion comprises determining, for each event, a set of event parameters. The event parameters include positional coordinates (x,y) representing a corresponding position of the respective image content in the frame image data (FI) having changed value between different image frames (Fm,Fn) in the sequence (SEQ). The event parameters of the frame event data (FEn) are processed, preferably by clustering, to determine at least one event-based region of interest (R) in the sequence (SEQ) of image frames. At least one classification (C) is calculated based on an intersection of the event-based region of interest (R) with the frame image data (FI) of an image frame (Fn) in the sequence (SEQ).
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile