The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 21, 2025
Filed:
Jun. 15, 2022
Dell Products L.p., Round Rock, TX (US);
Sukhada Chokkadi, Mangalore, IN;
Alan Dillane, Senec, SK;
Sai Namrata Gaur, Madhya Pradesh, IN;
Ashima Gupta, Bangalore, IN;
Lokeshwar Jha, New Delhi, IN;
Kristin Jean Kevern, Leander, TX (US);
Dinesh Koppada, Bengaluru, IN;
Petra Kropacek, Bratislava, SK;
Kannapiran Ramaswamy, Cedar Park, TX (US);
Sanchi Srivastava, Georgetown, TX (US);
Sivakami Swamynathan, Bangalore, IN;
Mrunal T V, Karnataka, IN;
Cheryl Young, Austin, TX (US);
Dell Products L.P., Round Rock, TX (US);
Abstract
Methods, apparatus, and processor-readable storage media for automated image analysis using artificial intelligence techniques are provided herein. An example computer-implemented method includes obtaining image data associated with at least one event; characterizing a plurality of attributes of the image data by processing at least a portion of the image data using one or more artificial intelligence techniques and processing metadata associated with at least a portion of the image data using one or more rule-based techniques; generating a determination as to whether one or more portions of the image data have been modified based at least in part on the plurality of characterized attributes of the image data; and performing one or more automated actions, based at least in part on the determination, in connection with at least one user request related to the image data associated with the at least one event.
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