The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 21, 2025
Filed:
Jul. 25, 2024
North China University of Technology, Beijing, CN;
University of Science and Technology Beijing, Beijing, CN;
Lifeng Zhang, Beijing, CN;
Haojian Duan, Beijing, CN;
Dinghan Li, Beijing, CN;
Yuexin Zhang, Beijing, CN;
Wei Chen, Beijing, CN;
Ying Ren, Beijing, CN;
North China University of Technology, Beijing, CN;
University of Science and Technology Beijing, Beijing, CN;
Abstract
A method analyzes global average grayscale change of tundish ink tracing experiment. The method includes the following steps: building a water model based on a prototype size and production parameters of a tundish; carrying out experiments by using the water model to obtain a video file of the ink tracing; processing the video file and extracting a characteristic curve of a global average grayscale changing with the time; analyzing the characteristic curve, and extracting a global peak grayscale time, a global tracer residual volume and a global emptying time as indicators for evaluating a tundish structure and flow characteristics of the tundish structure.