The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 21, 2025
Filed:
Jun. 14, 2022
Applicant:
Hitachi, Ltd., Tokyo, JP;
Inventors:
Assignee:
Hitachi, Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/24 (2005.12); G01R 19/25 (2005.12); G02B 21/36 (2005.12); G06T 7/00 (2016.12); G06T 7/62 (2016.12); H04N 7/18 (2005.12); H04N 23/695 (2022.12); H04N 23/90 (2022.12); G01N 21/88 (2005.12);
U.S. Cl.
CPC ...
G06T 7/0004 (2012.12); G01B 11/24 (2012.12); G01R 19/25 (2012.12); G02B 21/36 (2012.12); G06T 7/62 (2016.12); G06T 7/97 (2016.12); H04N 7/181 (2012.12); H04N 7/183 (2012.12); H04N 23/695 (2022.12); H04N 23/90 (2022.12); G01N 21/8851 (2012.12); G06T 2207/10056 (2012.12); G06T 2207/30164 (2012.12);
Abstract
Provided is a tool wear monitoring device configured to input a plurality of pieces of image data captured with a microscope camera while changing an angle, and to monitor tool wear. The tool wear monitoring device includes a data analysis unit configured to analyze image data. The data analysis unit binarizes the plurality of pieces of image data captured while changing an angle, extracts data in which a worn region has a maximum area among the plurality of pieces of image data, and analyzes the amount of wear from the extracted data with the maximum area.