The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2025

Filed:

May. 02, 2022
Applicant:

Sap SE, Walldorf, DE;

Inventors:

Lei Xu, Shanghai, CN;

Deng Feng Wan, Shanghai, CN;

Assignee:

SAP SE, Walldorf, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 40/00 (2019.12); G06F 40/166 (2019.12); G06F 40/279 (2019.12); G06Q 10/0631 (2022.12);
U.S. Cl.
CPC ...
G06F 40/279 (2019.12); G06F 40/166 (2019.12); G06Q 10/063112 (2012.12);
Abstract

Various examples are directed to systems and methods for characterizing natural language text units. A plurality of text units may be used to train a bidirectional model. A bidirectional model may be applied to a set of annotated text units to generate a plurality of span context vectors. The plurality of span context vectors may be used to train a span prediction model. The span prediction model may be applied to at least a portion of the plurality of text units to generate a plurality of span characterizations, a first span characterization corresponding to a first span indicating that the first span describes a first job skill.


Find Patent Forward Citations

Xu, Lei. (2025). Natural language processing to extract skills characterization (U.S. Patent No. 12282738). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12282738

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…