The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2025

Filed:

Jan. 02, 2024
Applicant:

Dell Products, L.p., Hopkinton, MA (US);

Inventors:

Ramesh Doddaiah, Westborough, MA (US);

Kaustubh Sahasrabudhe, Westborough, MA (US);

Malak Alshawabkeh, Franklin, MA (US);

Assignee:

Dell Products, L.P., Hopkinton, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/06 (2005.12);
U.S. Cl.
CPC ...
G06F 3/061 (2012.12); G06F 3/0655 (2012.12); G06F 3/0679 (2012.12);
Abstract

A random read miss slot size selection engine is configured to select between multiple memory slot sizes to optimize slot size allocations for random read miss IO operations. Upon receipt of an IO operation that is a random read miss IO operation, the slot size selection engine obtains a metadata page encompassing multiple entries in addition to an entry associated with the random read miss IO operation. The slot size selection engine performs a metadata temporal analysis to analyze temporal information associated with previous slot allocations identified in the metadata page. The slot size selection engine also performs a metadata spatial analysis to spatially analyze previous slot allocations to neighboring tracks identified in the metadata page. In response to a determination that the metadata page contains a threshold number of recent slot allocations, the spatial analysis is used to determine the slot size to allocate to the random read miss.


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