The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2025

Filed:

Mar. 03, 2024
Applicant:

Hewlett-packard Development Company, L.p., Spring, TX (US);

Inventors:

Martin Urrutia Nebreda, Sant Cugat del Valles, ES;

Marti Rius Rossell, Sant Cugat del Valles, ES;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03G 15/00 (2005.12); B65H 7/06 (2005.12);
U.S. Cl.
CPC ...
G03G 15/6567 (2012.12); B65H 7/06 (2012.12); B65H 2511/24 (2012.12); B65H 2553/51 (2012.12); B65H 2553/82 (2012.12); B65H 2557/61 (2012.12); B65H 2801/03 (2012.12);
Abstract

According to some examples, a skew detection device comprises a first roller rotatable around a first axis, a second roller rotatable around a second axis, a first sensor, and a second sensor. The first sensor measures a first rotation parameter from the first roller and the second sensor measures a second rotation parameter from the second roller. A movement of a print media over the device rotates the first contact roller and the second roller, and a controller determines a skew of the print media based on the first and second rotation parameters captured by the first sensor and the second sensor.


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