The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2025

Filed:

Nov. 24, 2020
Applicant:

Temple University-of the Commonwealth System of Higher Education, Philadelphia, PA (US);

Inventors:

Weidong Yang, Penn Valley, PA (US);

Andrew Ruba, Philadelphia, PA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/36 (2005.12); G01N 21/64 (2005.12); G02B 21/08 (2005.12); G02B 21/16 (2005.12);
U.S. Cl.
CPC ...
G02B 21/361 (2012.12); G01N 21/6458 (2012.12); G02B 21/08 (2012.12); G02B 21/16 (2012.12);
Abstract

The present invention discloses a photon enhancement apparatus comprising a reflective component and 4f coherent imaging system, which increases a photon collection efficiency. The present invention also provides a microscope comprising said photon enhancement apparatus and methods of improving photon collection efficiency, signal-to-noise ratio, and/or optical resolution using the said photon enhancement apparatus.


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