The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2025

Filed:

Dec. 12, 2019
Applicant:

Hitachi High-tech Corporation, Tokyo, JP;

Inventors:

Takeshi Setomaru, Tokyo, JP;

Hiroyuki Mishima, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 35/00 (2005.12); G01N 35/04 (2005.12);
U.S. Cl.
CPC ...
G01N 35/0092 (2012.12); G01N 35/00663 (2012.12); G01N 35/04 (2012.12);
Abstract

Provided are a device and a method capable of determining an optimal retrieving condition of a specimen rack according to various situations, when an error occurs in any specimen among a plurality of specimens mounted on the specimen rack. When the error occurs in a specimen accommodated in a specimen container mounted on the specimen rack, conveyance of the specimen rack is controlled on the basis of information about the specimen having the error and a specimen accommodated in another specimen container on the specimen rack on which the specimen container with the specimen accommodated therein is mounted, and the retrieval condition of the specimen rack.


Find Patent Forward Citations

Setomaru, Takeshi. (2025). Automatic analysis device (U.S. Patent No. 12282034). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12282034

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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