The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2025

Filed:

Dec. 04, 2022
Applicant:

Ticona Llc, Florence, KY (US);

Inventors:

Young Shin Kim, Cincinnati, OH (US);

Young Chul Yang, Seoul, KR;

Soohee Choi, Seoul, KR;

Assignee:

Tiocona LLC, Florence, KY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 3/303 (2005.12);
U.S. Cl.
CPC ...
G01N 3/303 (2012.12);
Abstract

A method for testing a sample for ball dent properties is provided. The method comprises disposing a sample on a stage of a testing apparatus and moving a trigger assembly that contains a tip having a radiused terminus toward the sample such that the terminus impacts the sample one or more times.


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