The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 21, 2025
Filed:
Jul. 28, 2021
Mitsubishi Heavy Industries, Ltd., Tokyo, JP;
Kyohei Hayashi, Tokyo, JP;
Masakazu Kamibayashi, Tokyo, JP;
MITSUBISHI HEAVY INDUSTRIES, LTD., Tokyo, JP;
Abstract
To further reduce the computational load in an inspection process of ultrasonic inspection of an inspection target. An ultrasonic inspection method includes the steps of: collecting data as a result of scanning an inspection target in such a manner that a plurality of probes transmit ultrasonic signals to the inspection target and the probes receive reflected ultrasonic signals from the inspection target; rendering a primary image including a contour and an internal side of the inspection target based on the data as the result of scanning by using a sonic speed of the ultrasonic signals transmitted and received by the probes, the sonic speed being set to a predetermined value regardless of a region through which the ultrasonic signals have passed; and evaluating whether an internal flaw is present in the inspection target in the primary image.