The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 21, 2025
Filed:
Aug. 30, 2022
Commissariat a L'energie Atomique ET Aux Energies Alternatives, Paris, FR;
Olivier Mesnil, Gif-sur-Yvette, FR;
Guillemette Ribay, Gif-sur-Yvette, FR;
Abstract
A method for detecting a defect in a structure of a device includes generating, only using the device, a low-frequency signal that makes the structure vibrate, generating a high-frequency signal in the structure, and measuring a vibratory signal caused by the generated low-frequency and high-frequency signals at the same time then adaptively re-sampling these measurements to obtain a re-sampled vibratory signal the power spectrum. The resampling includes a first frequency range [u; u] of width larger than 5 Hz that contains 95% of the power of the low-frequency signal, a second frequency range [u; u] of width systematically smaller than uthat contains 95% of the power of the low-frequency signal. A defect is signaled in the structure if an additional power lobe is detected outside of the ranges [u; u] and [u; u].