The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2025

Filed:

Nov. 19, 2020
Applicant:

Endress+hauser Flowtec Ag, Reinach, CH;

Inventors:

Alfred Rieder, Landshut, DE;

Robert Lalla, Lörrach, DE;

Marcel Braun, Inzlingen, DE;

Ennio Bitto, Aesch, CH;

Johan Pohl, Freiburg, DE;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01F 1/84 (2005.12); G01R 33/00 (2005.12); G01R 33/07 (2005.12);
U.S. Cl.
CPC ...
G01F 1/8422 (2012.12); G01F 1/8427 (2012.12); G01F 1/8436 (2012.12); G01R 33/0058 (2012.12); G01R 33/072 (2012.12);
Abstract

The measuring system comprises a vibration-type measuring sensor, a sensor housing, a magnetic-field detector, and measuring-system electronics electrically coupled both to an oscillation exciter and to oscillation-sensing devices of the measuring sensor. The measuring sensor is inside the sensor housing and the magnetic-field detector is outside the sensor housing. The magnetic-field detector is designed to convert changes in the magnetic field into a magnetic-field signal having an amplitude dependent on a magnetic flux through the magnetic-field detector and/or on an area density of said magnetic flux. The measuring-system electronics are designed to determine, on the basis of oscillation measurement signals of the measuring sensor, the mass-flow-rate measurement values representing the mass flow rate and to at least qualitatively determine, on the basis of the magnetic-field signal, whether an external magnetic field is established inside the measuring sensor.


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