The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2025

Filed:

May. 04, 2022
Applicant:

Here Global B.v., Eindhoven, NL;

Inventor:

Fei Tang, Aarau, CH;

Assignee:

HERE GLOBAL B.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/90 (2016.12); G01C 21/00 (2005.12); G06F 16/29 (2018.12); G06T 7/143 (2016.12); G06T 7/60 (2016.12);
U.S. Cl.
CPC ...
G01C 21/3867 (2020.07); G01C 21/3841 (2020.07); G01C 21/3859 (2020.07); G06F 16/29 (2018.12); G06T 7/143 (2016.12); G06T 7/60 (2012.12); G06T 7/90 (2016.12); G06T 2207/20044 (2012.12);
Abstract

A method is provided automatically creating map geometry from data from various sources gathered within a geographical area using data aggregation and conflation with statistical analysis. Methods may include: receiving observation data associated with a geographic area; rasterizing objects within the observation data onto corresponding channels in a raster image corresponding to the geographic area having a given resolution; determining a distribution of locations of the objects parameterized by values in different channels in the raster image from the observation data; extracting analytic geometries from the raster image; generating map geometry based on the extracted analytic geometries; and updating a map database with the generated map geometry.


Find Patent Forward Citations

Tang, Fei. (2025). Method, apparatus, and computer program product for map geometry generation based on data aggregation and conflation with statistical analysis (U.S. Patent No. 12281916). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12281916

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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