The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2025

Filed:

Apr. 05, 2021
Applicant:

Koninklijke Philips N.v., Eindhoven, NL;

Inventors:

Gilad Shechter, Haifa, IL;

Liran Goshen, Pardes-Hanna, IL;

Assignee:

KONINKLIJKE PHILIPS N.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2023.12); A61B 6/03 (2005.12); G06T 5/70 (2023.12); G06T 11/00 (2005.12);
U.S. Cl.
CPC ...
A61B 6/5264 (2012.12); A61B 6/032 (2012.12); G06T 5/70 (2023.12); G06T 11/008 (2012.12); G06T 2207/10081 (2012.12);
Abstract

A system (SYS) and related method for motion artifact reduction in X-ray imaging. The system (SYS) comprises an input interface (IN) for receiving a first input image (i1, I1) of an object (PAT) reconstructed from a first set of projection data, and a second input image (i2, I2) of the object reconstructed from a second set of projection data. The second set is smaller than the first set. A motion analyzer (MA) establishes an estimate for motion corruption based on the two input images. A selective combiner (Σ) computes an image value for an enhanced image (I1+I2, i1+i2), based on the motion estimate and on image information in the first input image (i1, I1) and/or the second input image (i2, I2).


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