The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2025

Filed:

Feb. 23, 2022
Applicant:

Topcon Corporation, Tokyo, JP;

Inventor:

Yoshikiyo Moriguchi, Tokyo, JP;

Assignee:

TOPCON CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 3/135 (2005.12); A61B 3/00 (2005.12); A61B 3/10 (2005.12);
U.S. Cl.
CPC ...
A61B 3/135 (2012.12); A61B 3/0008 (2012.12); A61B 3/102 (2012.12);
Abstract

An ophthalmic apparatus includes an irradiation optical system, an optical scanner, an optical splitting and combining unit, and a detector. The irradiation optical system includes a light source and is configured to generate measurement light using light from the light source. The optical scanner is configured to deflect the measurement light and to guide the deflected measurement light to a subject's eye. The optical splitting and combining unit is configured to guide the measurement light to the optical scanner and to generate interference light between reference light that is generated from the light from the light source and returning light of the measurement light from the subject's eye. The detector is configured to detect the returning light and the interference light via the optical splitting and combining unit.


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