The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 21, 2025
Filed:
Dec. 10, 2019
Refractive property measurement device, measurement tool, and refractive property measurement method
Hoya Lens Thailand Ltd., Pathumthani, TH;
Takashi Iizuka, Tokyo, JP;
HOYA LENS THAILAND LTD., Pathumthani, TH;
Abstract
A refractive property measurement apparatus to measure refractive properties of an eye includes: a disk provided with a first pinhole and a second pinhole that transmit light rays while narrowing them; a light emitting unit that emits a first light ray and a second light ray from different positions on a surface of the disk, so that light rays passed through the first pinhole and the second pinhole enter the eye; and a processing unit determines refractive properties of the eye from information of positions on a retina of the eye where the first light ray having passed through the first pinhole and the second light ray having passed through the second pinhole reach. The first pinhole includes a first optical element that transmits the first light ray, and the second pinhole includes a second optical element that has transmission characteristics of transmitting the second light ray.