The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 21, 2025
Filed:
Apr. 22, 2019
Stent Tek Limited, London, GB;
Sorin Popa, London, GB;
Robert Dickinson, London, GB;
Stent Tek Limited, London, GB;
Abstract
Aspects of the present invention relate to an apparatus for determining alignment between a source device and a target device. The apparatus comprises the source device, the target device, and a processing system. The source device comprises a first spatially variant field generator for generating a first spatially variant electric field, and a second spatially variant field generator for generating a second spatially variant electric field, wherein the second spatially variant electric field is angularly offset with respect to the first spatially variant electric field. The target device comprises at least one sensor configured to detect a first signal from the first spatially variant electric field and a second signal from the second spatially variant electric field. The processing system is configured to determine alignment between the first source device and the target device based on the first and second signals from the first and second spatially variant electric fields by the target device. The inventions further relate to the method of use of the apparatus and the processing system of the apparatus.