The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2025

Filed:

Sep. 06, 2021
Applicant:

Cnh Industrial America Llc, New Holland, PA (US);

Inventors:

Justin Becker, Elizabethtown, PA (US);

Mark D. Dilts, New Holland, PA (US);

Michael Minnich, Elizabethtown, PA (US);

Clayton E. Banks, Jr., Brownstown, PA (US);

Denver R. Yoder, Manheim, PA (US);

Assignee:

CNH Industrial America LLC, New Holland, PA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A01D 41/127 (2005.12); G01F 23/296 (2021.12);
U.S. Cl.
CPC ...
A01D 41/1275 (2012.12); G01F 23/296 (2012.12);
Abstract

An embodiment includes a system for sensing harvested grain levels within an agricultural harvester. The system including a grain tank configured to receive harvested grain, a sensor configured to emit a sensor beam into the grain tank for reflection off of the top surface of the harvested grain, and a reflective target integrated into a bottom surface of the grain tank at a minimum detectable grain level within the grain tank. The bottom surface of the grain tank being angled towards the sensor, the minimum detectable grain level being defined by a minimum grain level within the grain tank at which the top surface of the harvested grain is contacted by the sensor beam, and the reflective target being configured to reflect the sensor beam when the current grain level is vertically below the minimum detectable grain level.


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