The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 14, 2025
Filed:
Oct. 04, 2023
Ckd Corporation, Aichi, JP;
Yukihiro Taguchi, Aichi, JP;
Shozo Oda, Aichi, JP;
CKD CORPORATION, Aichi, JP;
Abstract
An inspection device includes: an illumination device; an imaging device that includes: an optical system that corrects a field curvature; an imaging element that takes an image via the optical system; and a mirror that reflects an incident light from the inspection object toward the optical system; and an inspection controller that: judges whether a quality of the inspection object is good or poor based on image data; and controls the imaging device to take an image of a first inspection area at a first timing when the first inspection area is located within a first focusing range, in which the first inspection area is focusable without the mirror, and to take an image of a second inspection area at a second timing when the second inspection area is located within a second focusing range, in which the second inspection area is focusable via the mirror.