The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 14, 2025
Filed:
Feb. 05, 2023
Qcify, Inc., San Mateo, CA (US);
Raf Peeters, San Mateo, CA (US);
Antoon De Cleen, Diest, BE;
Pieter Ieven, Genk, BE;
Ruben Praets, Leopoldsburg, BE;
Qcify Inc., San Mateo, CA (US);
Abstract
A method includes collecting measurement data of a sample, determining a confidence value associated with the measurement data, determining if the confidence value is less than a confidence threshold value, and causing the measurement data to be stored in a memory device if the confidence value is less than the confidence threshold value. The method further includes utilizing the measurement data for training of a machine learning system, thereby updating the operation of the machine learning system. The measurement data is measured by an inspection device located at a first location. In one example, the measurement data is a captured image captured by an optical inspector. The confidence value associated with the captured image represents the confidence of the machine learning system regarding what is displayed in the captured image.