The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 14, 2025
Filed:
Apr. 24, 2023
Applicant:
Airoha Technology Corp., Hsinchu, TW;
Inventors:
Jeng-Hong Chen, Manhattan Beach, CA (US);
Chun-Yuan Huang, Hsinchu County, TW;
Yun-Xuan Zhang, Taipei, TW;
Assignee:
Airoha Technology Corp., Hsinchu, TW;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 27/26 (2005.12); H04L 27/00 (2005.12);
U.S. Cl.
CPC ...
H04L 27/2675 (2012.12); H04L 27/0014 (2012.12); H04L 2027/0026 (2012.12);
Abstract
A frequency offset (FO) estimation method includes: sampling a frequency-modulated repetition-coded segment of a packet to generate a plurality of samples; obtaining a frequency deviation (FD) value for each of a plurality of target samples selected from the plurality of samples; and estimating an FO value through accumulating complete FD values of the plurality of target samples.
Chen, Jeng-Hong. (2025). Method and apparatus for estimating frequency offset through accumulating complete frequency deviation values of samples obtained from sampling frequency-modulated repetition-coded segment of packet (U.S. Patent No. 12278724). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12278724
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile