The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 14, 2025
Filed:
May. 16, 2023
Astronics Test Systems, Inc., Orlando, FL (US);
Gary Robert Kenworthy, Leesburg, FL (US);
ASTRONICS TEST SYSTEMS, Orlando, FL (US);
Abstract
A system and method for measuring characteristics of a signal transmission channel. A generator generates a defined signal as a function of user defined reference parameters, and injects the defined signal into an input of the signal transmission channel. An analyzer receives the defined signal from an output of the signal transmission channel. The analyzer also includes the user defined reference parameters, and measures a reference delay and reference frequency offset without any timing or phase reference synchronization with the generator. The analyzer computes a time-dependent (impulse response) and/or frequency-dependent (frequency response) variation of a response of the signal transmission channel relative to the reference delay and reference frequency offset.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile