The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 14, 2025
Filed:
Feb. 12, 2020
Qualcomm Incorporated, San Diego, CA (US);
Changhwan Park, San Diego, CA (US);
Bin Han, Beijing, CN;
Vijay Balasubramanian, San Diego, CA (US);
Mihir Vijay Laghate, San Diego, CA (US);
Valentin Alexandru Gheorghiu, Yokohama, JP;
Arash Mirbagheri, San Diego, CA (US);
QUALCOMM Incorporated, San Diego, CA (US);
Abstract
Embodiments include methods of testing wireless devices for beam forming performance. Various aspects may include determining measurements of communication performance of the wireless device at each of a number of different angular orientations of the wireless device with respect to an antenna within a test chamber, and determining whether the wireless device satisfies beam forming performance requirements by comparing the measurements of communication performance to pass/fail criteria. Further embodiments may include a wireless device testing apparatus configured to perform testing wireless devices for beam forming performance. In some embodiments, a wireless device testing apparatus may include a test chamber, an antenna within the test chamber, a rotatable positioning system within the test chamber configured to hold a wireless device and rotate the wireless device within a range of orientations with respect to the antenna, and a computing device coupled to the antenna and the rotatable positioning system.