The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2025

Filed:

Dec. 03, 2019
Applicant:

Semiconductor Energy Laboratory Co., Ltd., Atsugi, JP;

Inventors:

Jyo Saito, Kanagawa, JP;

Mayumi Mikami, Kanagawa, JP;

Yohei Momma, Kanagawa, JP;

Teruaki Ochiai, Kanagawa, JP;

Tatsuyoshi Takahashi, Kanagawa, JP;

Kazuhei Narita, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01M 4/525 (2009.12); H01M 4/02 (2005.12); H01M 4/36 (2005.12); H01M 10/0525 (2009.12); H01M 10/0569 (2009.12);
U.S. Cl.
CPC ...
H01M 4/525 (2012.12); H01M 4/366 (2012.12); H01M 10/0525 (2012.12); H01M 10/0569 (2012.12); H01M 2004/021 (2012.12); H01M 2004/028 (2012.12);
Abstract

A positive electrode active material that has high capacity and excellent charge and discharge cycle performance for a secondary battery is provided. A positive electrode active material that inhibits a decrease in capacity in charge and discharge cycles is provided. A high-capacity secondary battery is provided. A secondary battery with excellent charge and discharge characteristics is provided. A highly safe or reliable secondary battery is provided. A positive electrode active material contains lithium, cobalt, oxygen, and aluminum and has a crystal structure belonging to a space group R-3m when Rietveld analysis is performed on a pattern obtained by powder X-ray diffraction. In analysis by X-ray photoelectron spectroscopy, the number of aluminum atoms is less than or equal to 0.2 times the number of cobalt atoms.


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