The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2025

Filed:

May. 09, 2021
Applicant:

Cognex Corporation, Natick, MA (US);

Inventors:

Nathaniel Bogan, Natick, MA (US);

Andrew Hoelscher, Somerville, MA (US);

David J. Michael, Waban, MA (US);

Assignee:

Cognex Corporation, Natick, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06V 20/64 (2021.12); G06T 17/00 (2005.12);
U.S. Cl.
CPC ...
G06V 20/647 (2021.12); G06T 17/00 (2012.12); G06T 2200/04 (2012.12);
Abstract

The techniques described herein relate to methods, apparatus, and computer readable media configured to identify a surface feature of a portion of a three-dimensional (3D) point cloud. Data indicative of a path along a 3D point cloud is received, wherein the 3D point cloud comprises a plurality of 3D data points. A plurality of lists of 3D data points are generated, wherein: each list of 3D data points extends across the 3D point cloud at a location that intersects the received path; and each list of 3D data points intersects the received path at different locations. A characteristic associated with a surface feature is identified in at least some of the plurality of lists of 3D data points. The identified characteristics are grouped based on one or more properties of the identified characteristics. The surface feature is identified based on the grouped characteristics.


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