The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2025

Filed:

Aug. 25, 2022
Applicant:

Hon Hai Precision Industry Co., Ltd., New Taipei, TW;

Inventors:

Tsung-Wei Liu, New Taipei, TW;

Chin-Pin Kuo, New Taipei, TW;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06V 10/776 (2021.12); G01S 13/86 (2005.12); G06T 7/55 (2016.12); G06T 7/73 (2016.12);
U.S. Cl.
CPC ...
G06T 7/55 (2016.12); G01S 13/867 (2012.12); G06T 7/74 (2016.12); G06V 10/776 (2021.12); G06T 2207/10016 (2012.12); G06T 2207/10028 (2012.12); G06T 2207/20081 (2012.12); G06T 2207/20084 (2012.12); G06T 2207/30244 (2012.12);
Abstract

This application provides a method for optimizing a depth estimation model. The method includes obtaining a video of an object and capturing a first image and a second image from the video. An initial depth estimation model is obtained. An updated depth estimation model is obtained by performing an optimization process on the initial depth estimation model, and the optimization process is repeatedly performed on the updated depth estimation model. Once the updated depth estimation model meets predetermined requirements, the updated depth estimation model meeting predetermined requirements is determined as a target depth estimation model.


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