The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 14, 2025
Filed:
Feb. 20, 2022
Leica Microsystems Cms Gmbh, Wetzlar, DE;
LEICA MICROSYSTEMS CMS GMBH, Wetzlar, DE;
Abstract
A multispectral microscope system includes a first detector element for capturing a first image of a sample in a first spectral channel, and at least a second detector element for capturing a second image of the sample in a second spectral channel. The first detector element includes a first detector array. The second detector element includes a second detector array different from the first detector array. The microscope system further includes a processor for determining a spatial correlation between the first and second images based on a spectral crosstalk between the first and second spectral channels and registering the first and second images based on the spatial correlation.